Mapping of optical element transmittance with spatial and
spectral resolution (with manually prepared report)
Test procedure:
A flat optical element is assessed using transmission linear spectroscopy with spatial resolution. The procedure consists of two sequential scans:
- Localization Scan: A low-resolution raster scan is performed to identify the object of interest in collecting a transmittance spectrum at each point over a broad area.
- High-Resolution Scan: Once the object is localized, a second scan is conducted with higher spatial resolution, using a focused beam and a predefined step size within a spectral range from UV to IR.
The collected spectra from both scans are post-processed to generate maps of selected spectral features, such as transmittance at a defined wavelength or spectral interval, positions of minima and maxima, and spectral edge positions.
Spectral mapping is used to discover surface contamination, laser affected discoloration areas, and non-uniformity of the coating layers.
If the sample has a region of interest (e.g. sites, irradiated by a laser), please comment or attach a file, indicating this region and its details.