Prediction of optics lifetime in fs and ps regime at kHz repetition rate.
Test procedure:
A classical lifetime testing approach is based on S-on-1 testing. The sample’s surface is divided into a virtual matrix of sites. Each test site is visually inspected under a microscope before laser exposure. Then it is exposed to a burst of S laser pulses at fixed laser peak fluence. Distinct fluence levels are applied for individual test sites. After exposure, the status of the irradiated site is assessed offline, and categorized as "survived," "non-catastrophic," or "catastrophic" damage. These assessments, along with damage statistics, are then used to calculate the LIDT for each failure mode resulting from the applied laser pulses (exposure dose S). Different amounts of laser pulses (S) are applied, and the S-on-1 procedure is repeated to establish LIDT dependence on exposure dose for each failure mode. By analyzing LIDT data trends over time using advanced statistical methods, long-term behavior is predicted, enabling estimation of useful lifetime at the desired fluence level.
Learn more: "Classical" Lifetime Test procedure