The PCI-based low-loss absorptance testing
in dielectric coatings at ppm
level.
Photothermal Common-path Interferometry (PCI) is widely used for characterizing low-loss optical absorptance of dielectric coatings at ppm levels. It employs a spatially resolved pump-probe technique, where a low-power probe beam detects the heating effect of an absorbed pump beam. The probe beam interferes with itself to measure phase shifts in the wavefronts. The basic absorptance test involves three scan procedures:
- Transverse scan (T-Scan);
- Longitudinal scan (L-scan);
- Time-scan (absorption is monitored at one site for 10 minutes).
Learn more: PCI absorptance testing
Presets:
PCI Scan Bundle: L-, T-, Time
PCI Basic Absorptance Test consists of 3 scans: T-scan, L-scan, Time scan.